3

Removal of contamination and oxide layers from UHV-AFM tips

Year:
1998
Language:
english
File:
PDF, 329 KB
english, 1998
5

[Nano Science and Technolgy] Applied Scanning Probe Methods IX ||

Year:
2008
Language:
english
File:
PDF, 9.17 MB
english, 2008
9

Piezoelectric and eletrostrictive ceramics for STM

Year:
1987
Language:
english
File:
PDF, 102 KB
english, 1987
11

STM study of epitaxial growth of Ge on Si(001)

Year:
1991
Language:
english
File:
PDF, 597 KB
english, 1991
14

STM study of the Ge growth mode on Si(001) substrates

Year:
1994
Language:
english
File:
PDF, 1.28 MB
english, 1994
16

STM study of initial stage of Ge epitaxy on Si(001)

Year:
1992
Language:
english
File:
PDF, 1.70 MB
english, 1992
17

STM study of geometric and electronic structures of Ge dimers on Si(001)

Year:
1992
Language:
english
File:
PDF, 881 KB
english, 1992
24

Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy

Year:
2000
Language:
english
File:
PDF, 172 KB
english, 2000
34

Visualization of tip-surface geometry at atomic distance by TEM-STM holder

Year:
1996
Language:
english
File:
PDF, 869 KB
english, 1996
43

An applicability of scanning tunneling microscopy for surface electron spectroscopy

Year:
2001
Language:
english
File:
PDF, 346 KB
english, 2001
45

Piezoelectric and electrostrictive ceramics for STM

Year:
1987
Language:
english
File:
PDF, 546 KB
english, 1987
47

STM study of epitaxial growth of Ge on Si(001)

Year:
1991
Language:
english
File:
PDF, 2.88 MB
english, 1991
48

High resolution tunneling microscopies: from FEM to STS

Year:
1992
Language:
english
File:
PDF, 1.47 MB
english, 1992
49

STM study of Ge overlayers on Si(001)

Year:
1992
Language:
english
File:
PDF, 818 KB
english, 1992